Yield Improvement Using Configurable Analogue Transistors (CATs)

Wilson, P. and Wilcock, R. (2008) Yield Improvement Using Configurable Analogue Transistors (CATs). Electronics Letters . (In Press)

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Abstract

Continued process scaling has led to significant yield and reliability challenges for today’s designers. Analogue circuits are particularly susceptible to poor variation, driving the need for new yield resilient techniques in this area. This paper describes a new configurable analogue transistor structure and supporting methodology that facilitates variation compensation at the post-manufacture stage. The approach has demonstrated significant yield improvements and can be applied to any analogue circuit.

Item Type:	Article
Creator/Authors:	Peter Wilson Reuben Wilcock
Research Group:	Current ECS Groups > Electronics and Electrical Engineerineering Old ECS Groups > Electronic Systems and Devices Group
Date:	2008
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Performance Indicator:	EZ~02~02~10
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Downloads (2010):	74
ID Code:	16667
Last Modified:	23 Sep 2011 10:37
Deposited On:	15 Sep 2008 18:41 by Wilson, Peter

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