Wilson, P. and Wilcock, R. (2008) Yield Improvement Using Configurable Analogue Transistors (CATs). Electronics Letters . (In Press)
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Abstract
Continued process scaling has led to significant yield and reliability challenges for today’s designers. Analogue circuits are particularly susceptible to poor variation, driving the need for new yield resilient techniques in this area. This paper describes a new configurable analogue transistor structure and supporting methodology that facilitates variation compensation at the post-manufacture stage. The approach has demonstrated significant yield improvements and can be applied to any analogue circuit.
| Creators: | Peter Wilson, Reuben Wilcock |
|---|---|
| Item Type: | Article |
| Research Group: | Electronic Systems and Devices Group |
| Deposited On: | 15 Sep 2008 19:41 by Wilson, Peter |
| ID Code: | 16667 |
| Last Modified: | 11 Nov 2009 12:40 |
| Performance Indicator: | EZ~02~02~10 |
| Citations: | Google Scholar: 2 |
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