Items from Current ECS Groups > Electronics and Electrical Engineerineering > High Voltage Laboratory in 1997
(Grouped by Item Type)

Article

Dissado, L. A., Doble, I., Wolfe, S. W., Norman, P. A., Davies, A. E., Chen, G., Zhong, Q., Wargotz, W. B. and Sanders, M. M. (1997) Electrical reliability of DC operated submarine telecommunication cables. IEEE Transactions Dielectrics and Elect. Insul., 4 (1). pp. 1-9. ISSN 1070-9878

Hosier, I. L., Vaughan, A. S. and Swingler, S. G. (1997) Structure-property relationships in polyethylene blends: the effect of morphology on electrical breakdown strength. J. Mater. Sci., 32 (17). pp. 4523-31. ISSN 0022-2461

Minto, C. D. G. and Vaughan, A. S. (1997) Orientation and conductivity in polyaniline: 1. Polymer, 38 (11). pp. 2683-8. ISSN 0032-3861

Conference or Workshop Item

Chen, G., Banford, H. M. and Davies, A. E. (1997) Space charge formation in gamma-irradiated LDPE. In: The Dielectrics Society 28th Annual Conference:-Charges in Solid Dielectrics. paper 5.6.

Dissado, L. A., Chen, G., Davies, A. E. and Norman, P. A. (1997) Space charge and interface reliability in underwater telecommunication systems. In: IEEE Conference on Electrical Insulation and Dielectric Phenomena. pp. 15-18.

Hosier, I. L., Vaughan, A. S., Sutton, S. J. and Swingler, S. G. (1997) Simulations of surface discharge damage in polymers using laser ablation and computational modelling techniques. In: International Conference on Dielectrics and Insulation. pp. 349-52.

Hosier, I. L., Vaughan, A. S. and Swingler, S. G. (1997) Dielectric breakdown in polyethylene: the effect of morphology and molecular composition. In: Proceedings of the International Conference on Dielectrics and Insulation. pp. 261-4.

Vaughan, A. S. (1997) Electron microscopy and polymers: designing material properties through structural control. In: Materials Characterisation - How can we do it? What can it tell us?. 3/1-4.

Other

Wu, X., Swingler, S. G., Hampton, R. N., Sutton, S. and Davies, A. E. (1997) Space charge measurement on XLPE plaques under dc conditions.