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Items from Current ECS Groups > Electronics and Electrical Engineerineering > High Voltage Laboratory in 1998
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Number of items: 11.


Abo el Maaty, M., Hosier, I. L. and Bassett, D. C. (1998) A unified context for spherulitic growth in polymers. Macromolecules, 31 (1). pp. 153-157.


Chen, G., Banford, H. M. and Davies, A. E. (1998) Influence of radiation environments on space charge formation in gamma-irradiated low density polyethylene. In: Intel Symp. on Electrical Insulating Materials. pp. 113-6.

Chen, G., Banford, H. M. and Davies, A. E. (1998) Space charge formation in gamma-irradiated low density polyethylene. IEEE Transactions Dielectrics and Electrical Insulation, 5 (1). pp. 51-57. ISSN 1070-9878

Crook, S. E. and Chappell, P. H. (1998) A portable system for closed loop control of the paralysed hand using Functional Electrical Stimulation.


Davies, A. E., Wu, X., Hampton, R. H., Sutton, S. and Swingler, S. G. (1998) The effect of ageing and preconditioning on charge density estimations in XLPE.


Lewin, P. L. (1998) Measurement of surface charge using the Pockels effect. (Invited Paper). In: IEE Colloquium (98/235) Surface Phenomena Affecting Insulator Performance.. pp. 1-3.


Minto, C. D. G. and Vaughan, A. S. (1998) Orientation and conductivity in polyaniline 2: chloroform cast films. Synth. Metals, 93 (1). pp. 73-6. ISSN 0379-6779


Vasquez, A., Chen, G., Davies, A. E. and Bosch, R. (1998) Space charge measurement using PEA technique and signal recovery. In: Intel. Conf. Functional Electroceramics and Thin Films. pp. 135-8.

Vaughan, A. S. (1998) Polymer surfaces: designing materials to prevent or withstand discharge activity. In: Surface Phenomena Affecting Insulator Performance. 9/1-3.

Vaughan, A. S., Robbie, D. A., Hosier, I. L. and Sutton, S. J. (1998) Simulations of surface discharge damage on self-supporting fibre optic cables. In: Plastics in Telecommunications VIII. pp. 87-96.


Zhao, Y., Yang, D. C. and Vaughan, A. S. (1998) Deformation process and mechanism of HDPE/LDPE blends. Chem. J. Chinese U., 19 (2). pp. 328-9. ISSN 0251-0790

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