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Items from Old ECS Groups > Microelectronics Industrial Unit in 2006
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Gili, E., Kunz, D., Uchino, T., Hakim, M. M. A., de Groot, C. H., Ashburn, P. and Hall, S. (2006) Asymmetric gate induced drain leakage and body leakage in vertical MOSFETs with reduced parasitic capacitance. IEEE Transactions on Electron Devices, 53 (5). pp. 1080-1087.

This list was generated on Sun May 26 00:56:09 2013 BST.

Items from Old ECS Groups > Microelectronics Industrial Unit in 2006 (Grouped by Creator/Authors Name)

G

Items from Old ECS Groups > Microelectronics Industrial Unit in 2006
(Grouped by Creator/Authors Name)