nb. next round of REF2013 will NOT be using data from eprints.ecs, but the central university REF interface.
Items from Current ECS Groups > Nano Group in 1979
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Ashburn, P. and Bull, C. J. (1979) Observations of dislocations and junction irregularities in bipolar transistors using the EBIC mode of the SEM.
Ashburn, P., Bull, C. J. and Beale, J. R. A. (1979) The use of the electron beam induced current mode of the SEM for observing emitter/collector pipes.
Bull, C. J., Ashburn, P., Booker, G. R. and Nicholas, K. H. (1979) Effects of dislocations in silicon transistors with implanted emitters.