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Items from Current ECS Groups > Nano Group in 1979
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Number of items: 4.

Ashburn, P. (1979) Current-voltage characteristics of emitter/collector pipes in bipolar transistors.

Ashburn, P. and Bull, C. J. (1979) Observations of dislocations and junction irregularities in bipolar transistors using the EBIC mode of the SEM.

Ashburn, P., Bull, C. J. and Beale, J. R. A. (1979) The use of the electron beam induced current mode of the SEM for observing emitter/collector pipes.

Bull, C. J., Ashburn, P., Booker, G. R. and Nicholas, K. H. (1979) Effects of dislocations in silicon transistors with implanted emitters.

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