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Items from Current ECS Groups > Optoelectronics Research Centre in 1989
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Murray, D. C., Siabi-Shahrivar, N., Evans, A. G. R., Redman-White, W., Carter, J. C. and Altrip, J. L. (1989) Increased low frequency noise generating defects in today's CMOS/BICMOS technologies. In: UNSPECIFIED.

This list was generated on Thu May 23 00:57:35 2013 BST.
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